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[IEEE 6th International Conference on Properties and Applications of Dielectric Materials - Xi'an, China (21-26 June 2000)] Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials (Cat. No.00CH36347) - Classification of PD patterns from multiple defects

✍ Scribed by June-Ho Lee, ; Okamoto, T.; Chin Woo Yi,

Book ID: 127352764
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 189 KB
Edition: 2000
Volume: 1
Category: Article
ISBN-13: 9780780354593
DOI: 10.1109/icpadm.2000.875730

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