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[IEEE 6th International Conference on Properties and Applications of Dielectric Materials - Xi'an, China (21-26 June 2000)] Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials (Cat. No.00CH36347) - Classification of defects in solid insulation material by PD methods

✍ Scribed by Park, Y.G.; Lee, H.K.; Kim, W.S.; Lim, K.J.; Kang, S.H.; Ree, J.H.; Kim, B.H.

Book ID: 115537228
Publisher: IEEE
Year: 2000
Weight: 269 KB
Volume: 2
Category: Article
ISBN-13: 9780780354593
DOI: 10.1109/icpadm.2000.876338

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