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[IEEE 6th International Conference on Properties and Applications of Dielectric Materials - Xi'an, China (21-26 June 2000)] Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials (Cat. No.00CH36347) - Influence of heating on dielectric relaxation phenomena of electron beam irradiated PEEK

✍ Scribed by Shinyama, K.; Baba, M.; Fujita, S.

Book ID: 126763728
Publisher: IEEE
Year: 2000
Weight: 288 KB
Volume: 2
Category: Article
ISBN-13: 9780780354593
DOI: 10.1109/ICPADM.2000.876372

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