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[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - SNAP: VLF/LF statistical noise analyzer

✍ Scribed by Neubert, J.A.

Book ID: 126627458
Publisher: IEEE
Year: 1989
Weight: 443 KB
Category: Article
DOI: 10.1109/IMTC.1989.36894

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