𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - An overview of radar cross section measurement techniques

✍ Scribed by Tice, T.E.

Book ID: 120262544
Publisher: IEEE
Year: 1989
Weight: 272 KB
Category: Article
DOI: 10.1109/IMTC.1989.36882

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 6th IEEE Conference Record., Instr

[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Unified approach to measurement signal reconstruction

✍ Morawski, R.Z. 📂 Article 📅 1989 🏛 IEEE ⚖ 342 KB

[IEEE 6th IEEE Conference Record., Instr

[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Simulation of ISAR image errors

✍ Jain, A.; Patel, I. 📂 Article 📅 1989 🏛 IEEE ⚖ 582 KB

[IEEE 6th IEEE Conference Record., Instr

[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - SNAP: VLF/LF statistical noise analyzer

✍ Neubert, J.A. 📂 Article 📅 1989 🏛 IEEE ⚖ 443 KB

[IEEE 6th IEEE Conference Record., Instr

[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - A system for surveying power quality

✍ Hairabedian, B. 📂 Article 📅 1989 🏛 IEEE ⚖ 186 KB

[IEEE 6th IEEE Conference Record., Instr

[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Ultra-black nickel-phosphorus alloy optical absorber

✍ Kodama, S.; Horiuchi, M.; Kuroda, K.; Kunii, T. 📂 Article 📅 1989 🏛 IEEE ⚖ 640 KB

[IEEE 6th IEEE Conference Record., Instr

[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Knowledge-based troubleshooting and diagnosis of electronic devices

✍ Vaez-Ghaemi, R. 📂 Article 📅 1989 🏛 IEEE ⚖ 357 KB