✦ LIBER ✦

[IEEE 56th Annual Device Research Conference Digest - Charlottesville, VA, USA (22-24 June 1998)] 56th Annual Device Research Conference Digest (Cat. No.98TH8373) - Currents, surface potentials, and defect generation in 1.2-1.5 nm oxide MOSFETs

✍ Scribed by Tiwari, S.; Welser, J.J.; DiMaria, D.J.; Rana, F.

No coin nor oath required. For personal study only.

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