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[IEEE 56th Annual Device Research Conference Digest - Charlottesville, VA, USA (22-24 June 1998)] 56th Annual Device Research Conference Digest (Cat. No.98TH8373) - Evaluation of AlGaN-GaN HFETs up to 750°C

✍ Scribed by Daumiller, I.; Kirchner, C.; Kamp, K.; Ebeling, K.J.; Pond, L.; Weitzel, C.E.; Kohn, E.

Book ID: 111958809
Publisher: IEEE
Year: 1998
Weight: 321 KB
Edition: ANNUAL
Volume: 0
Category: Article
ISBN-13: 9780780349957
DOI: 10.1109/drc.1998.731144

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