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[IEEE 4th International Symposium on Power Semiconductor Devices and Ics - Tokyo, Japan (May 19-21, 1992)] Proceedings of the 4th International Symposium on Power Semiconductor Devices and Ics - Failure prediction of power devices under reverse surge current conditions

✍ Scribed by Freydin, B.; Velmre, E.; Udal, A.

Book ID: 126626706
Publisher: IEEE
Year: 1992
Weight: 365 KB
Category: Article
DOI: 10.1109/ISPSD.1992.991247

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