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[IEEE 49th ARFTG Conference Digest - Denver, CO, USA (1997.06.13-1997.06.13)] 49th ARFTG Conference Digest - An Accurate Determination of the Characteristic Impedance Matrix of Coupled Symmetrical Lines on Chips Baser on High Frequency S-Parameter Measurements

✍ Scribed by Winkel, Thomas-Michael; Dutta, Lohit Sagar; Grabinski, Hartmut

No coin nor oath required. For personal study only.

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