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[IEEE 49th ARFTG Conference Digest - Denver, CO, USA (1997.06.13-1997.06.13)] 49th ARFTG Conference Digest - 60 GHz On-Wafer Noise Parameter Measurements Using Cold-Source Method

✍ Scribed by Lahdes, Manu; Sipila, Markku; Tuovinen, Jussi

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