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[IEEE 48th Midwest Symposium on Circuits and Systems, 2005. - Covington, KY, USA (2005.08.7-2005.08.10)] 48th Midwest Symposium on Circuits and Systems, 2005. - A comparator-based I/sub DDQ/ testing of CMOS analog and mixed-signal integrated circuits

✍ Scribed by Siva Yellampalli, ; Ashok Srivastava,

Book ID: 126768416
Publisher: IEEE
Year: 2005
Weight: 256 KB
Category: Article
ISBN-13: 9780780391970
DOI: 10.1109/MWSCAS.2005.1594068

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