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[IEEE 48th Midwest Symposium on Circuits and Systems, 2005. - Covington, KY, USA (2005.08.7-2005.08.10)] 48th Midwest Symposium on Circuits and Systems, 2005. - RTL fault modeling

✍ Scribed by Karunaratne, M.; Sagahayroon, A.; Prodhuturi, S.

Book ID: 125544802
Publisher: IEEE
Year: 2005
Weight: 227 KB
Category: Article
ISBN-13: 9780780391970
DOI: 10.1109/MWSCAS.2005.1594451

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