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[IEEE 3rd IEEE International Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO 95 - London, UK (27 Nov. 1995)] Proceedings of the 3rd IEEE International Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO 95 - Noise and gain performance of pseudomorphic-HEMT vs temperature for microwave low-noise applications

✍ Scribed by Livreri, P.; Sannino, M.

Book ID: 126609510
Publisher: IEEE
Year: 1995
Weight: 187 KB
Category: Article
ISBN-13: 9780780325371
DOI: 10.1109/EDMO.1995.493704

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