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[IEEE 3rd IEEE International Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO 95 - London, UK (27 Nov. 1995)] Proceedings of the 3rd IEEE International Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO 95 - Nonlinear common source MESFET behaviour and model validation

✍ Scribed by Passiopoulos, G.; Webster, D.R.; Parker, A.E.; Haigh, D.G.

Book ID: 121276591
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 470 KB
Category: Article
ISBN-13: 9780780325371
DOI: 10.1109/EDMO.1995.493706

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