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[IEEE 33rd International Symposium on Multiple-Valued Logic, 2003. - Meiji University, Tokyo, Japan (16-19 May 2003)] 33rd International Symposium on Multiple-Valued Logic, 2003. Proceedings. - Experimental and simulation studies of single-electron-transistor-based multiple-valued logic

✍ Scribed by Inokawa, H.; Takahishi, Y.

Book ID: 120004395
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 887 KB
Category: Article
ISBN-13: 9780769519180
DOI: 10.1109/ISMVL.2003.1201415

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