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[IEEE 27th Annual Proceedings., International Reliability Physics Symposium - Phoenix, AZ, USA (11-13 April 1989)] 27th Annual Proceedings., International Reliability Physics Symposium - Aging effects in GaAs Schottky barrier diodes

✍ Scribed by Christianson, K.A.

Book ID: 126721736
Publisher: IEEE
Year: 1989
Weight: 515 KB
Category: Article
DOI: 10.1109/RELPHY.1989.36319

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