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[IEEE 20th IEEE International Conference on Software Maintenance, 2004. Proceedings. - Chicago, IL, USA (11-14 Sept. 2004)] 20th IEEE International Conference on Software Maintenance, 2004. Proceedings. - A process for improving software testability

✍ Scribed by Lamoreaux, T.; Ofori-Kyei, M.; Pinone, M.

Book ID: 126766695
Publisher: IEEE
Year: 2004
Weight: 193 KB
Category: Article
ISBN-13: 9780769522135
DOI: 10.1109/ICSM.2004.1357850

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