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[IEEE 20th IEEE International Conference on Software Maintenance, 2004. Proceedings. - Chicago, IL, USA (11-14 Sept. 2004)] 20th IEEE International Conference on Software Maintenance, 2004. Proceedings. - Module metric signature (MMS) visualization

✍ Scribed by Zage, D.; Zage, W.

Book ID: 126751448
Publisher: IEEE
Year: 2004
Weight: 190 KB
Category: Article
ISBN-13: 9780769522135
DOI: 10.1109/ICSM.2004.1357857

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