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[IEEE 20th Biennial Conference on Precision Electromagnetic Measurements - Braunschweig, Germany (17-21 June 1996)] Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements - Experimental comparison of "load-pull" measurement systems for nonlinear power transistor characterization

✍ Scribed by Berghof, G.; Deshours, F.; Bergeault, E.; Villotte, J.P.; Villeforceix, B.

Book ID: 121280152
Publisher: IEEE
Year: 1996
Weight: 218 KB
Category: Article
ISBN-13: 9780780333765
DOI: 10.1109/CPEM.1996.547338

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