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[IEEE 20th Biennial Conference on Precision Electromagnetic Measurements - Braunschweig, Germany (17-21 June 1996)] Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements - Loading effects in resistance scaling

✍ Scribed by Elmquist, R.E.; Dziuba, R.F.

Book ID: 120193722
Publisher: IEEE
Year: 1996
Weight: 221 KB
Category: Article
ISBN-13: 9780780333765
DOI: 10.1109/CPEM.1996.547101

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