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[IEEE 2014 IEEE Workshop On Microelectronics And Electron Devices (WMED) - Boise, ID, USA (2014.04.18-2014.04.18)] 2014 IEEE Workshop On Microelectronics And Electron Devices (WMED) - Invited talk: CMOS device scaling — Past, present, and future

✍ Scribed by Taur, Yuan

Book ID: 127172452
Publisher: IEEE
Year: 2014
Weight: 107 KB
Category: Article
ISBN: 1479922226
DOI: 10.1109/wmed.2014.6818711

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