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[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - Electrostatics and performance benchmarking using all types of III–V multi-gate FinFETs for sub 7nm technology node logic application

✍ Scribed by Baek, R.-H.; Kim, D.-H.; Kim, T.-W.; Shin, CS.; Park, WK.; Michalak, T.; Borst, C.; Song, S. C.; Yeap, Geoffrey; Hill, R.; Hobbs, C.; Maszara, W.; Kirsch, P.

Book ID: 126493839
Publisher: IEEE
Year: 2014
Weight: 724 KB
Category: Article
ISBN: 1479933309
DOI: 10.1109/VLSIT.2014.6894420

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