✦ LIBER ✦

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Sensitivity analysis of a technique for the extraction of interface trap density in SiC MOSFETs from subthreshold characteristics

✍ Scribed by Hughart, D. R.; Flicker, J. D.; Atcitty, S.; Marinella, M. J.; Kaplar, R. J.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2014 IEEE International Reliabilit

✍ Weber, Eduard; Echtle, Klaus 📂 Article 📅 2014 🏛 IEEE ⚖ 365 KB

[IEEE 2014 IEEE International Reliabilit

✍ Grasser, T.; Rott, K.; Reisinger, H.; Waltl, M.; Franco, J.; Kaczer, B. 📂 Article 📅 2014 🏛 IEEE ⚖ 423 KB

[IEEE 2014 IEEE International Reliabilit

✍ Haggag, Amr; Phillips, Michael; Lee, J.K. Jerry 📂 Article 📅 2014 🏛 IEEE ⚖ 739 KB

[IEEE 2014 IEEE International Reliabilit

✍ Christiansen, Cathryn; Chapple-Sokol, Jonathan; Coster, Michael; Hunt, Douglas; 📂 Article 📅 2014 🏛 IEEE ⚖ 698 KB

[IEEE 2014 IEEE International Reliabilit

✍ Kindereit, Ulrike 📂 Article 📅 2014 🏛 IEEE ⚖ 553 KB

[IEEE 2014 IEEE International Reliabilit

✍ Mahapatra, S.; Huard, V.; Kerber, A.; Reddy, V.; Kalpat, S.; Haggag, A. 📂 Article 📅 2014 🏛 IEEE ⚖ 931 KB