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[IEEE 2014 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2014.5.28-2014.5.30)] 2014 IEEE International Conference on IC Design & Technology - Highly-reliable TaOx reram technology using automatic forming circuit

✍ Scribed by Kawai, Ken; Kawahara, Akifumi; Yasuhara, Ryutaro; Muraoka, Shunsaku; Wei, Zhiqiang; Azuma, Ryotaro; Tanabe, Kouhei; Shimakawa, Kazuhiko

Book ID: 126762563
Publisher: IEEE
Year: 2014
Weight: 834 KB
Category: Article
ISBN: 147992153X
DOI: 10.1109/ICICDT.2014.6838600

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