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[IEEE 2014 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2014.5.28-2014.5.30)] 2014 IEEE International Conference on IC Design & Technology - Testing, diagnosis and repair methods for NBTI-induced SRAM faults

✍ Scribed by Liu, Bao; Chen, Chiung-Hung

Book ID: 126287417
Publisher: IEEE
Year: 2014
Weight: 630 KB
Category: Article
ISBN: 147992153X
DOI: 10.1109/ICICDT.2014.6838608

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