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[IEEE 2014 27th International Conference on VLSI Design - India (2014.01.5-2014.01.9)] 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems - A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits

✍ Scribed by Millican, Spencer K.; Saluja, Kewal K.

Book ID: 125503910
Publisher: IEEE
Year: 2014
Weight: 260 KB
Category: Article
ISBN: 1479925136
DOI: 10.1109/VLSID.2014.11

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