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[IEEE 2014 27th International Conference on VLSI Design - India (2014.01.5-2014.01.9)] 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems - Application of Test-View Modeling to Hierarchical ATPG

✍ Scribed by Shukla, Rahul; Loi, Phong; Pham, Ken; Margulis, Arie; Yang, Kathy; Tamarapalli, Nagesh

Book ID: 126500999
Publisher: IEEE
Year: 2014
Weight: 808 KB
Category: Article
ISBN: 1479925136
DOI: 10.1109/VLSID.2014.26

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