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[IEEE 2014 15th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2014.03.3-2014.03.5)] Fifteenth International Symposium on Quality Electronic Design - TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits

✍ Scribed by Hsueh, Sung S.-Y.; Huang, Ryan H.-M.; Wen, Charles H.-P.

Book ID: 126768373
Publisher: IEEE
Year: 2014
Weight: 483 KB
Category: Article
ISBN: 1479939455
DOI: 10.1109/ISQED.2014.6783372

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