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[IEEE 2014 15th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2014.03.3-2014.03.5)] Fifteenth International Symposium on Quality Electronic Design - A workload-aware-design of 3D-NAND flash memory for enterprise SSDs

✍ Scribed by Sun, Chao; Soga, Ayumi; Onagi, Takahiro; Johguchi, Koh; Takeuchi, Ken

Book ID: 124158009
Publisher: IEEE
Year: 2014
Weight: 404 KB
Category: Article
ISBN: 1479939455
DOI: 10.1109/ISQED.2014.6783376

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