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[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Efficient test and repair architectures for 3D TSV-based random access memories

✍ Scribed by Shyue-Kung Lu, ; Uang-Chang Lu, ; Seng-Wen Pong, ; Hao-Cheng Cheng,

Book ID: 121476209
Publisher: IEEE
Year: 2013
Weight: 637 KB
Category: Article
ISBN: 1467344354
DOI: 10.1109/VLDI-DAT.2013.6533889

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