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[IEEE 2013 International Conference on Noise and Fluctuations (ICNF) - Montpellier, France (2013.06.24-2013.06.28)] 2013 22nd International Conference on Noise and Fluctuations (ICNF) - Study of low-frequency noise in SOI tri-gate silicon nanowire MOSFETs

✍ Scribed by Koyama, M.; Casse, M.; Coquand, R.; Barraud, S.; Ghibaudo, G.; Iwai, H.; Reimbold, G.

Book ID: 125847670
Publisher: IEEE
Year: 2013
Weight: 316 KB
Category: Article
ISBN: 1479906689
DOI: 10.1109/ICNF.2013.6578950

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