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[IEEE 2013 International Conference on Noise and Fluctuations (ICNF) - Montpellier, France (2013.06.24-2013.06.28)] 2013 22nd International Conference on Noise and Fluctuations (ICNF) - Low-frequency noise as a diagnostic tool for OLED reliability

✍ Scribed by Rocha, P. R. F.; Vandamme, L. K. J.; Meskers, S. C. J.; Gomes, H. L.; De Leeuw, D. M.; van de Weijer, P.

Book ID: 121204884
Publisher: IEEE
Year: 2013
Weight: 379 KB
Category: Article
ISBN: 1479906689
DOI: 10.1109/ICNF.2013.6578947

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