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[IEEE 2013 International Conference on IC Design & Technology (ICICDT) - Pavia, Italy (2013.05.29-2013.05.31)] Proceedings of 2013 International Conference on IC Design & Technology (ICICDT) - Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits

✍ Scribed by Suzuki, Masamichi; Kinoshita, Atsuhiro; Mitani, Yuichiro

Book ID: 125433757
Publisher: IEEE
Year: 2013
Weight: 387 KB
Category: Article
ISBN: 1467347418
DOI: 10.1109/icicdt.2013.6563335

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