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[IEEE 2013 International Conference on Advances in Electrical Engineering (ICAEE) - Dkaka, Bangladesh (2013.12.19-2013.12.21)] 2013 2nd International Conference on Advances in Electrical Engineering (ICAEE) - Effect of high k-dielectric as gate oxide on short channel effects of junction-less transistor

โœ Scribed by Sayem, Ayed Al; Arafat, Yeasir; Rahman, Md. Mushfiqur


Book ID
125455741
Publisher
IEEE
Year
2013
Weight
447 KB
Category
Article
ISBN
1479924644

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