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[IEEE 2013 International Conference on Advances in Electrical Engineering (ICAEE) - Dkaka, Bangladesh (2013.12.19-2013.12.21)] 2013 2nd International Conference on Advances in Electrical Engineering (ICAEE) - Gate leakage in hafnium oxide high-k metal gate nMOSFETs

โœ Scribed by Rao, Ashutosh; Mukhopadhyay, Gautam


Book ID
121849337
Publisher
IEEE
Year
2013
Weight
523 KB
Category
Article
ISBN
1479924644

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