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[IEEE 2013 IEEE Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Columbus, OH, USA (2013.10.27-2013.10.29)] The 1st IEEE Workshop on Wide Bandgap Power Devices and Applications - Modelling of temperature dependence on current collapse phenomenon in AlGaN/GaN HEMT devices

✍ Scribed by Samudra, Ganesh S.; Liang, Yung C.; Li, Yuling; Yeo, Yee-Chia

No coin nor oath required. For personal study only.

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