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[IEEE 2013 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2013) - San Francisco, CA, USA (2013.07.8-2013.07.12)] 2013 IEEE Radiation Effects Data Workshop (REDW) - Single Event Response of the Samsung 16G NAND Flash

✍ Scribed by Oldham, Timothy R.; Wilcox, Edward P.; Friendlich, Mark R.

Book ID: 121790167
Publisher: IEEE
Year: 2013
Weight: 375 KB
Category: Article
ISBN: 1479911372
DOI: 10.1109/REDW.2013.6658212

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