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[IEEE 2013 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2013) - San Francisco, CA, USA (2013.07.8-2013.07.12)] 2013 IEEE Radiation Effects Data Workshop (REDW) - Recent Radiation Test Results for Power MOSFETs

✍ Scribed by Lauenstein, Jean-Marie; Topper, Alyson D.; Casey, Megan C.; Wilcox, Edward P.; Phan, Anthony M.; Kim, Hak S.; LaBel, Kenneth A.

Book ID: 121791411
Publisher: IEEE
Year: 2013
Weight: 794 KB
Category: Article
ISBN: 1479911372
DOI: 10.1109/REDW.2013.6658205

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