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[IEEE 2013 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2013) - San Francisco, CA, USA (2013.07.8-2013.07.12)] 2013 IEEE Radiation Effects Data Workshop (REDW) - In-Situ TID Test of 4-Gbit DDR3 SDRAM Devices

✍ Scribed by Herrmann, Martin; Grurmann, Kai; Gliem, Fritz; Schmidt, Hagen; Ferlet-Cavrois, Veronique

Book ID: 121788198
Publisher: IEEE
Year: 2013
Weight: 514 KB
Category: Article
ISBN: 1479911372
DOI: 10.1109/REDW.2013.6658199

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