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[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - Characterization of MIM diodes based on Nb/ Nb2O5

✍ Scribed by Hashem, Islam E.; Rafat, Nadia H.; Soliman, Ezzeldin A.

Book ID: 123619063
Publisher: IEEE
Year: 2013
Weight: 359 KB
Category: Article
ISBN: 1467348414
DOI: 10.1109/INEC.2013.6465954

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