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[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - The side effects on N-Type FinFET Devices

✍ Scribed by Yang, Hsin-Chia; Du, Chong-Kuan; Liao, Wen-Shiang; Jhang, Jing-Zong; Lee, Yi-Hong; Chen, Tsao-Yeh; Liao, Ko-Fan; Wang, Mu-Chun; Chi, Sungching; Wang, Shea-Jue

Book ID: 121399326
Publisher: IEEE
Year: 2013
Weight: 427 KB
Category: Article
ISBN: 1467348414
DOI: 10.1109/INEC.2013.6466084

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