✦ LIBER ✦

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Threshold behavior of the drift region: The missing piece in LDMOS modeling

✍ Scribed by Sque, S. J.; Scholten, A. J.; Aarts, A. C. T.; Klaassen, D. B. M.

No coin nor oath required. For personal study only.

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