𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Where are we going? Product scaling in the system on chip era

✍ Scribed by Taylor, Gregory F

Book ID: 121795838
Publisher: IEEE
Year: 2013
Weight: 456 KB
Category: Article
ISBN: 1479923060
DOI: 10.1109/IEDM.2013.6724645

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2013 IEEE International Electron D

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Gigahertz multi-transistor graphene integrated circuits

✍ Sordan, Roman; Ferrari, Andrea C. 📂 Article 📅 2013 🏛 IEEE ⚖ 813 KB

[IEEE 2013 IEEE International Electron D

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - High-performance multi-stage graphene RF receiver integrated circuit

✍ Shu-Jen Han, ; Valdes Garcia, Alberto; Oida, Satoshi; Jenkins, Keith A.; Haensch 📂 Article 📅 2013 🏛 IEEE ⚖ 807 KB

[IEEE 2013 IEEE International Electron D

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Vertical nanowire InGaAs MOSFETs fabricated by a top-down approach

✍ Zhao, Xin; Lin, Jianqiang; Heidelberger, Christopher; Fitzgerald, Eugene A.; del 📂 Article 📅 2013 🏛 IEEE ⚖ 879 KB

[IEEE 2013 IEEE International Electron D

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - First demonstration of RRAM patterned by block copolymer self-assembly

✍ Wu, Yi; Yi, He; Zhang, Zhiping; Jiang, Zizhen; Sohn, Joon; Wong, Simon; Wong, H. 📂 Article 📅 2013 🏛 IEEE ⚖ 894 KB

[IEEE 2013 IEEE International Electron D

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Threshold behavior of the drift region: The missing piece in LDMOS modeling

✍ Sque, S. J.; Scholten, A. J.; Aarts, A. C. T.; Klaassen, D. B. M. 📂 Article 📅 2013 🏛 IEEE ⚖ 270 KB

[IEEE 2013 IEEE International Electron D

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Exploring the design space of non-planar channels: Shape, orientation, and strain

✍ Stanojevic, Zlatan; Karner, Markus; Kosina, Hans 📂 Article 📅 2013 🏛 IEEE ⚖ 392 KB