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[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Electric field profile measurement and modeling in multi-dielectrics for HVDC application

✍ Scribed by Vu, T. T. N.; Teyssedre, G.; Vissouvanadin, B.; Le Roy, S.; Laurent, C.; Mammeri, M.; Denizet, I.

Book ID: 121751547
Publisher: IEEE
Year: 2013
Weight: 339 KB
Category: Article
ISBN: 147990807X
DOI: 10.1109/ICSD.2013.6619749

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