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[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Investigation of factors inducing simultaneous discharges in voids

✍ Scribed by Wu, Kai; Pan, Cheng; Meng, Yongpeng; Cheng, Yonghong; Ding, Man

Book ID: 121655350
Publisher: IEEE
Year: 2013
Weight: 366 KB
Category: Article
ISBN: 147990807X
DOI: 10.1109/ICSD.2013.6619798

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