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[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - Sensitivity enhancement of ion sensors by charge trapping on Extended Gate Field Effect Transistors

โœ Scribed by Ho, K. I.; Chen, C. H.; Lu, C. F.; Lai, Chao-Sung; Chun-Chang, ; An-thung Cho, ; Chang, J-J; Chiang, M. F.


Book ID
121861974
Publisher
IEEE
Year
2013
Weight
617 KB
Category
Article
ISBN
1467325236

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