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[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Gate stack resistance and limits to CMOS logic performance

โœ Scribed by Wachnik, R. A.; Lee, S.; Pan, L. H.; Lu, N.; Li, H.; Bingert, R.; Randall, M.; Springer, S.; Putnam, C.


Book ID
127164406
Publisher
IEEE
Year
2013
Weight
450 KB
Category
Article
ISBN
1467361461

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