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[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Scalable behavior modeling for 3D field-programmable ESD protection structures

✍ Scribed by Wang, L.; Wang, X.; Shi, Z. T.; Ma, R.; Zhang, C.; Dong, Z.; Lu, F.; Zhao, H.; Wang, A.

Book ID: 126271405
Publisher: IEEE
Year: 2013
Weight: 665 KB
Category: Article
ISBN: 1467361461
DOI: 10.1109/CICC.2013.6658492

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