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[IEEE 2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS) - Taipei, Taiwan (2013.01.20-2013.01.24)] 2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS) - Analysis of linearity degradation in multi-stage RF MEMS circuits

✍ Scribed by Shah, U.; Sterner, M.; Oberhammer, J.

Book ID: 120256054
Publisher: IEEE
Year: 2013
Weight: 681 KB
Category: Article
ISBN: 1467356549
DOI: 10.1109/MEMSYS.2013.6474351

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