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[IEEE 2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE) - Pasadena, CA, USA (2013.11.4-2013.11.7)] 2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE) - A pattern-based approach for GUI modeling and testing

✍ Scribed by Moreira, Rodrigo M. L. M.; Paiva, Ana C. R.; Memon, Atif

Book ID: 126843696
Publisher: IEEE
Year: 2013
Weight: 605 KB
Category: Article
ISBN: 1479923664
DOI: 10.1109/issre.2013.6698881

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